We help you solve the smallest problems imaginable.
We help you solve the smallest problems imaginable.
Custom Nanotech helps nanotechnology companies solve their most critical technical and manufacturing challenges faster and at lower cost. As an extension of our clients’ in-house R&D team, Custom Nanotech instantly brings some of the best nano-technology problem solving experience and skills available, reduces the time associated with hiring and training new technical staff and eliminates the expense of building out a lab of specialized equipment.
Our team has decades of experience solving the toughest nano-device design, nano-processing and nano-fabrication challenges. And we help give our clients cost-effective and instant access to a full range of processing and characterization equipment that would cost tens of millions of dollars and many months to build in-house.
What our customers are saying:
“If your organization has the need for the expertise and services provided by firms like Custom Nanotech, it would be a mistake not to give them the opportunity to help you. You will not be disappointed.”
Idea
Theory
Prototyping
Development
Manufacturing
Packaging
Wherever you are in your development cycle. We can help.
Copyright 2010 - Custom Nanotech LLC.
Keywords: nano-technology, nanotechnology, carbon nanotubes, synthesis of 1-Dimensional Nano-materials (carbon nanotubes, GaN, ZnO and Silicon nanowires), Nanostructure Manipulation, Optical lithography, Soft-Lithography, Electron Beam Lithography, Photo-Mask Fabrication, Focused Ion Beam milling/deposition (FIB), Reactive Ion Etching, Inductively Coupled Plasma, Bosch Processes, Wet Etching, Sputtering, Thermal Evaporation, E-beam Evaporation, Chemical Vapor Deposition (LPCVD), Plasma Enhanced Chemical Vapor Deposition (PECVD), Atomic Layer Deposition (ALD), Thermal Oxidation, Diffusion, Wafer Bonding, Chemical Mechanical Polishing., Scanning Electron Microscopy (SEM), Energy-Dispersive Spectrometry (EDS), X-Ray Diffraction (XRD), X-Ray Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM), Four-Point Probe, Ellipsometry.